Dr M Navneethan Convener and HOD (Department of nanotechnology) explains the working of the ZEM3 to the Chief guest Dr M Kamruddin, Associate Director, MMG, IGCAR along with Dr C Muthamizhchelvan (Director, E&T) and visiting professors from Shizuoka University Japan- Prof Ikeda, Prof Shimomura and Prof Hayakawa

SRM Institute of Science and Technology is now equipped with Advanced Characterization Facilities, which consists of Laser Flash Thermal conductivity, Seebeck Coefficient Measurement System, Cryogenic Probe Station and Semiconductor Parameter Analyzer.
These state-of-the-art facilities were inaugurated at the Nanotechnology Research Centre, in the Kattankulathur campus recently. A workshop on ‘Advanced Characterization of Material and Devices’ was held as part of the event.
The facility was inaugurated by Dr. M Kamruddin, Associate Director, ANG division, IGCAR Kalpakkam. He was joined by Dr. C Muthamizhchelvan, Director (Engineering and Technology) SRMIST, Prof. Masaru Shimomura, Prof. Hiroya Ikeda and Prof Yasuhiro Hayakawa from Shizuoka University (SU), Japan,
Speaking on the occasion, Dr. Kamruddin said, “All these facilities are dream instruments. Private universities and organizations should chip in more for Research and Development. It is good that SRMIST is working towards bringing such world class facilities under one roof. These facilities are open to everyone from all over the world where researchers can send in their samples do their work.”
Dr Muthamizhchelvan said, “Research is not confined to one department, therefore, these facilities are open to all. Researchers can send their samples through online booking and gain access to the latest equipment through our website nrc.srmonline.net.”
The facilities LFA 467 Hyperflash and ZEM3 are fully sponsored by SRMIST at a cost of Rs 3.5 crores. The other existing facilities at SRMIST include X-Ray Photoelectron Spectroscopy (XPS), High-Resolution Transmission Electron Microscope (HR-TEM), Field Emission Scanning Electron Microscope( FESEM), Vibrating-Sample Magnetometer (VSM) , X-Ray Diffractometer (XRD), Scanning Probe Microscope (SPM) High Resolution Mass Spectrometry ( HRMS) and many more along with a supercomputer typically used for scientific and engineering applications.
Dr. M Navaneethan, convener and HOD ( Department of Nanotechnology),Dr E Senthil Kumar,Dr Kamala Bharathi, Dr John Thiruvadigal ,Dean (Sciences) ,SRMIST were also present.